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DETERMINATION OF THE PROPORTIONAL CONTENTS OF INGREDIENTS IN IN_XAL_1-XP, IN_XGA_1-XP, AND AP_XGA_1-XP BY RADIOACTIVE SOURCE X-RAY FLUOROSCOPYMILLER D; SHRETER U; WEIL R et al.1980; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1980; VOL. 51; NO 7; PP. 3902-3906; BIBL. 14 REF.Article

Chromium silicide formation by ion mixing = Formation de siliciure de chrome par mélange ioniqueSHRETER, U; SO, F. C. T; NICOLET, M.-A et al.Journal of applied physics. 1984, Vol 55, Num 10, pp 3500-3504, issn 0021-8979Article

Influence of F and Cl on the recrystallization of ion-implanted amorphous SiSUNI, I; SHRETER, U; NICOLET, M.-A et al.Journal of applied physics. 1984, Vol 56, Num 2, pp 273-278, issn 0021-8979Article

Phase-locked semiconductor laser array with separate contactsKATZ, J; KAPON, E; LINDSEY, C et al.Applied physics letters. 1983, Vol 43, Num 6, pp 521-523, issn 0003-6951Article